Metrology Interest Group

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13th International Conference on Metrology and Properties of Engineering Surfaces


This conference focuses on the progress made in surface metrology, surface characterisation instrumentation and properties of engineering surfaces.

New optical metrology technique

Alicona Imaging GmbH have pioneered a new optical measurement technique that allows in-depth metrology of 3-D surfaces in the micro and nano range, and meets the ISO 25178 standard for topographical measurement. Full story on

European Metrology Research Programme (EMRP)

A call for potential metrology research topics on EMRP is open now to any entity or individual. The deadline for submissions is 28th March 2010.



euspenEuspen provides an entrepreneurial network of leading industrialists and researchers working in the field of precision, micro and nano engineering. euspen’s 10th International Conference takes place in Delft, Netherlands from 31st May to 4th June 2010.

Fundamental Principles of Engineering Nanometrology

Leach on nanometrologyThis new book provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study.

4th congress on Micro and Nano Manufacturing

Micromachines - Supporting the 4M Association

MDPI - Supporting the 4M Association

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Metrology Interest Group

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