Metrology in Micro Manufacturing - workshop

21/10/2009

In partnership with CEMMNT, MM Live is pleased to announce the introduction of the Metrology in Micro Manufacturing Workshop, which will take place during the afternoon session of 21st October, of the Micro Manufacturing Conference.

Chairman's Introduction & Welcome
Paul Newbatt, CEMMNT

CEMMNT - A Measurement & Characterisation Service for the Micro Manufacturing Industry
Paul Newbatt, CEMMNT

Measurement & Characterisation of Modern Structured Surfaces
Prof. Richard Leach, Principal Research Scientist, NPL

See the Light: Laser Micro Fabrication
David Barrow, Professor in Micro & Nano Technology, MetaFAB

Automated Flight Simulation Across a Micro-Surface: Quantifying the Surface in 2D & 3D with a New Interferometer
Mike Conroy, Non-Contact Product Manager, Ametek Taylor Hobson

Optical 3D Measurements by Focus Variation for Quality Assurance in the Micro and Nano Range
Brian Kyte, Director, Alicona UK

3.30 pm End of Conference

4th congress on Micro and Nano Manufacturing

Micromachines - Supporting the 4M Association

MDPI - Supporting the 4M Association

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